Electronics Weekly

Test firm intros DFT system

Test firm intros DFT systemNews from E-InSiteTeseda, an IC-test equipment startup from Portland, Oregon, has introduced the Teseda Validator 500, which it claims is the first design-for-test (DFT) ...
EDN

DFT: A systems technology for system chips

Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
Design-Reuse

SynTest Receives "Multiple-capture DFT system for scan-based integrated circuits" Patent for At-Speed Scan/BIST Invention

SAN JOSE, Calif., Oct 19, 2005-- SynTest Technologies, Inc., a leading supplier of Design-for-Test (DFT) tools, was granted 33 claims on Oct. 11, 2005 under United States Patent # 6,954,887 for its ...
EDN

Teseda introduces new version of the V500 DFT-focused engineering test system

Teseda (Portland, OR; www.teseda.com) has announced the new release of the V500 DFT-Focused engineering test system. New features and options include support for delay (AC) scan and IDDQ test ...
Electronic Design

Expanded DFT-Focused Test System Takes On More Applications

The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
Semiconductor Engineering

High Performance, Low Power, And Test: DFT’s Impact On System PPA And Safety

Back in the day, test was an afterthought in system design and implementation. It was a separate task that could be added to the end of a project schedule—essentially, a checkbox before sending a ...