Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...
Bruker has announced the release of the Dimension Icon® SSRM-HR, a new atomic force microscope (AFM) configuration including the Scanning Spreading Resistance Microscopy (SSRM) module, designed ...
Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, today announced ...
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